Introduction and Background
The concepts of Statistical Process Control (SPC) were initially developed by Dr. Walter Shewhart of Bell Laboratories in the 1920's, and were expanded upon by Dr. W. Edwards Deming, who introduced SPC to Japanese industry after WWII. After early successful adoption by Japanese firms, Statistical Process Control has now been incorporated by organizations around the world as a primary tool to improve product quality by reducing process variation.
Dr. Shewhart identified two sources of process variation: Chance variation that is inherent in process, and stable over time, and Assignable, or Uncontrolled...